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Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I)
An increase in the CHIP hardware introduces lots of test challenges at advanced (lower technology ... These are all latched to the start of the ATPG cycle for each pattern. The latching function ...
The test-board includes several channels of varying materials and lengths. Using an octal configuration we drive a pattern through transmitter channels either to an oscilloscope or back to the ...
Your Horse on MSN6d
British rider who learned the wrong dressage test pulls off a PB and confesses: ‘I hate cross-country’British rider Fiona Kashel has known she would be competing at the Mars Badminton Horse Trials for less than a week, having got the call to say she was in off the waitlist last Saturday (3 May). The ...
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